کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1545412 997593 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Atomic-scale characterization of silicon diffusion on carbon nanotubes
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Atomic-scale characterization of silicon diffusion on carbon nanotubes
چکیده انگلیسی
► Stable adsorption sites for a single Si atom adsorption on the outer surface of single-walled carbon nanotubes were studied in detail. ► Relative stability of equilibrium configurations above different C−C bonds cannot be judged only by the relative reactivity of the C−C bonds, due to the radial deformation of tube caused by adsorption of Si atom. This is contrary to the case of the adsorption of C and N. ► Energetically favorable diffusion paths were determined, which is crucial for the growth of silicon carbide nanotubes. No studies on this issue have been reported.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica E: Low-dimensional Systems and Nanostructures - Volume 43, Issue 2, December 2010, Pages 610-613
نویسندگان
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