Spatial distribution of strong and weak coupled exciton-polaritons in semiconductor microcavities

The coexistence of polaritons in different coupling regimes inside the same excited area is experimentally studied in InGaAs semiconductor microcavities by means of spatially and time-resolved photoluminescence. Different positions inside the spot are selected with a resolution of 10 μm in order to analyze the spatial distribution of polaritons, which present different emission energies. Island with a high density of polaritons are present at every scanned position and their spatial distribution follows the Gaussian profile of the excitation intensity.