کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1547952 1512910 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Scanning a metallic tip close to a quantum point contact
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Scanning a metallic tip close to a quantum point contact
چکیده انگلیسی
Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance resonances appear to be related to the local potential within the channel of the point contact. As a consequence, the point contact with its conductance resonances can be used as a sensor for the local tip-induced potential.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica E: Low-dimensional Systems and Nanostructures - Volume 32, Issues 1–2, May 2006, Pages 167-170
نویسندگان
, , , , , , , , ,