Effect of swift heavy ion irradiation on magnetic, surface morphology and electronic transport across CoFe/n-Si interfacial structures

• CoFe/n-Si interfaces have been irradiated from SHI.
• Significant increment has been observed in value of saturation magnetization of SHI irradiated CoFe/n-Si structure.
• Current across the interface gets increased for SHI irradiated structures.
• The observed results could be understood in the realm of SHI induced modifications.

In this study, swift heavy ion induced modifications on magnetic, morphological and electronic transport properties of CoFe/n-Si bilayers was investigated. Structural investigations have revealed the interfacial intermixing across the interface upon irradiation to result in the formation of magnetic silicide phases with enhanced crystallite size as compared to unirradiated structure. On irradiation, surface topography (from atomic force microscopy) has revealed the columnar arrangement of grains with increased value of rms surface roughness which in turn also affects the magnetic behaviour. Magnetization measurements have shown the enhancement in saturation magnetization and coercivity value with increased magnetic signal strength after irradiation. Current–voltage measurement across the irradiated CoFe/n-Si interface has shown the enhancement in current data by two orders of magnitude as compared to unirradiated interface. The observed significant changes in magnetic and transport properties for the irradiated interface has been explained on the basis of disorder/defect creation and interfacial chemistry modifications in the structure due to swift heavy ions.

In the present stydy, Magnetization is found to increase after swift heavy ion irradiation of CoFe/n-Si interfacial structures.Figure optionsDownload as PowerPoint slide