کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1554329 | 1513250 | 2009 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electrical property of nonvolatile memory with SiC nano-particles formed in SiO2
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Nonvolatile memory device with SiC nano-particles formed in SiO2 was fabricated and its electrical properties were evaluated. The SiC and SiO2 thin layer were deposited by radio-frequency magnetron sputtering in the argon gas ambient. The SiC nano-particles were formed after post thermal annealing at 900  âC for 3 min, and then their average size appeared at about 10 nm and was distributed between tunnel oxide and control oxide layers. The flat-band voltage shift in a gate capacitor structure with SiC nano-particles appeared at about 5.1 V when the induced gate voltage was swept from ±14 V. Also, the memory window of nonvolatile memory devices to define write and erase conditions were about 2.7 V during the operations at ±12 V for 1 s. According to these write and erase conditions, it was maintained at about 1.2 V after 104 s at the charge-retention characteristics.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Superlattices and Microstructures - Volume 46, Issues 1â2, JulyâAugust 2009, Pages 182-187
Journal: Superlattices and Microstructures - Volume 46, Issues 1â2, JulyâAugust 2009, Pages 182-187
نویسندگان
Tae Hee Lee, Dong Uk Lee, Eun Kyu Kim, Jin-Wook Shin, Won-Ju Cho,