کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1555034 | 1513252 | 2008 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
In-situ study of the interface formation in organic multilayers
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: In-situ study of the interface formation in organic multilayers In-situ study of the interface formation in organic multilayers](/preview/png/1555034.png)
چکیده انگلیسی
Organic molecular beam epitaxy (OMBE) is the growth technique assuring high quality films and properly designed multilayers of organic molecular materials in view of both their fundamental studies and applications. To monitor in-situ the OMBE growth, we have applied reflectance anisotropy spectroscopy (RAS), which is particularly effective and sensitive, being non destructive for organic materials. In this work, RAS is used to monitor, in-situ, the growth of organic heterostructures. The experiment is carried out using organic single crystals as substrates and oligothiophenes as molecular materials to build a stack of layers. A layer-by-layer growth of the films is demonstrated, together with the formation of interfaces with peculiar optical behavior and structure.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Superlattices and Microstructures - Volume 44, Issues 4â5, OctoberâNovember 2008, Pages 550-555
Journal: Superlattices and Microstructures - Volume 44, Issues 4â5, OctoberâNovember 2008, Pages 550-555
نویسندگان
A. Sassella, A. Borghesi, M. Campione, L. Raimondo, C. Goletti, G. Bussetti, P. Chiaradia,