کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1618574 1005707 2010 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Size dependence of creep behavior in nanoscale Cu/Co multilayer thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
Size dependence of creep behavior in nanoscale Cu/Co multilayer thin films
چکیده انگلیسی

Cu/Co multilayers with periodicity of 4–40 nm were prepared by electron beam evaporation deposition. Microstructure and room temperature creep behavior were investigated by X-ray diffraction, transmission electron microscopy and nanoindentation test. The results show that superlattice structure forms with decreasing periodicity and coherent interfaces come into being at low periodicity of 4 nm. Size dependence of the creep behavior is observed and power-law creep parameters including stress exponent and size sensitivity index are calculated by dimension analysis. A dislocation model for predicting the steady-state deformation of multilayers with semi-coherent interfaces is presented. Nanoscale effects are explained by dislocation generation and annihilation mechanisms involving single dislocations slip in confined layers and dislocations climb at the interfaces, respectively. Model predictions agree well with experimental observation.

Research highlights▶ Cu/Co superlattice structure forms with decreasing periodicity. ▶ It exhibits size dependence of the creep behavior and power-law creep parameters. ▶ A dislocation model for steady-state deformation of semi-coherent films is presented. ▶ Nanoscale effects are related to dislocation generation and annihilation at interfaces.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 506, Issue 1, 10 September 2010, Pages 434–440
نویسندگان
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