Investigations on the properties of solid solutions of pseudo-binary lead chalcogenides

Lead chalcogenides and their solid solutions with detecting and lasing capabilities have great technological importance. High quality polycrystalline thin films of solid solutions of pseudo-binary lead chalcogenides have been deposited onto ultra clean glass substrates by vacuum evaporation technique. Optical, electrical and structural properties of the thin films of the solid solutions of pseudo-binary lead chalcogenides have been investigated. Absorption coefficient and band gap of films were determined by absorbance measurements in wavelength range 2500-5000 nm using FTIR spectrophotometer. dc conductivity and activation energy of films were measured in temperature range 300-380 K using two probe I-V characteristics method. Crystal structure and lattice parameters of films were determined from X-ray diffractogram.