Structural and dielectric properties of Pb(Zr,Ti)O3 heterolayered thick films

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(30/70) and PZT(70/30) pastes were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated several times to form the heterolayered thick films. The thickness of the films after one cycle of drying/coating was approximately 18 μm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT-6 thick film were 1593 and 1.11%, respectively. And the PZT-6 film shows the remanent polarization of 19.4 μC/cm2 and coercive field of 21.7 kV/cm.