Characterization of the yttria-stabilized zirconia thin film electrophoretic deposited on La0.8Sr0.2MnO3 substrate

The yttria-stabilized zirconia (YSZ) thin films electrophoretic deposited on the La0.8Sr0.2MnO3 (LSM) substrate have been characterized by using zeta potential analysis, X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The La2Zr2O7 (LZ) formed at the interface between the YSZ thin film and LSM substrate, after sintered at 1400 °C for 52 h, are identified by XRD. The zeta potential of the YSZ particles in pure ethanol–acetone is about 7.8 mV, but when the I2 concentration is greater than 0.6 g/1, the zeta potential attains a constant value, 46 mV. The relation between deposit weight of the YSZ films and the applied voltage shows a non-linear behavior. Thickness of the YSZ thin film deposited on the LSM substrate by electrophoretic deposition is controlled by a diffusion process. A larger LZ with the thickness of 200 nm is formed at the interface between the YSZ film and the LSM substrate.