Metalorganic chemical vapor deposition of metal oxide films exhibiting electric-pulse-induced resistance switching

Pr1−xCaxMnO3 (PCMO) films with the desired atomic composition were deposited on Pt/SiO2/Si substrates by metalorganic chemical vapor deposition (MOCVD) using in situ infrared spectroscopic monitoring. The I-V characteristics exhibited nonlinear, asymmetric, and hysteretic behavior in PCMO-based devices with top electrode of Al or Ti. The electric-pulse-induced resistance switching was observed in the PCMO-based devices. The resistance change was dependent on the Pr/Ca composition ratio of the PCMO films and the kind of the top electrodes.