کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1790866 | 1524450 | 2013 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Post-growth thermal annealing study of CdZnTe for developing room-temperature X-ray and gamma-ray detectors Post-growth thermal annealing study of CdZnTe for developing room-temperature X-ray and gamma-ray detectors](/preview/png/1790866.png)
Post-growth annealing is a potentially promising method of improving the properties of CZT for fabricating room-temperature X-ray and gamma-ray detectors. In this paper, we summarize some of our recent research on annealing detector-grade CZT crystals. Our results show that annealing in a Cd vapor effectively removes Te inclusions from CZT. The migration of Te inclusions was also observed for annealing in a temperature-gradient field. We recorded a loss of resistivity of the detector-grade CZT after annealing in a Cd vapor. The underlying mechanism of this loss was discussed, and solutions including two-step annealing (Cd annealing followed by Te annealing) and one-step annealing with Cd and Zn pressure control were proposed to maintain high resistivity.
► Annealing in a Cd vapor effectively removes Te inclusions from CZT.
► Migration of Te inclusions was observed in the temperature-gradient annealing.
► We recorded a loss of resistivity of CZT after annealing in a Cd vapor.
► We discussed the underlying mechanism and the related solutions of this loss.
Journal: Journal of Crystal Growth - Volume 379, 15 September 2013, Pages 16–20