Properties of (h 0 0)-oriented La1−xNaxMnO3 films (x=0.1, 0.15 and 0.3) prepared by chemical solution deposition method

Chemical solution deposition method as a useful method for preparation of oxide films was used to fabricate La1−xNaxMnO3 (LNMO, x=0.1, 0.15 and 0.3) films on LaAlO3 (1 0 0) substrates. The XRD results showed that all the three prepared films were highly (h 0 0)-oriented, and the lattice constant was decreased with the increase of the Na content; Moreover, the Curie temperature as well as the insulator-metal transition temperature was increased. Additionally, it was found that within the range of the studied Na content, all the three films behaved like highly oriented or epitaxial films without obvious magnetoresistance (MR) value in low temperature regions and the temperature of the maximum MR was located near room temperature and tended to higher temperature with the increase of the Na content.