کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1812889 | 1025626 | 2010 | 6 صفحه PDF | دانلود رایگان |
Zinc oxide (ZnO) thin films have been deposited with various substrate temperatures by spray pyrolysis technique onto glass substrates. X-ray diffraction (XRD) results showed the random growth orientation of the crystallites and the presence of the wurtzite phase of ZnO. The x-ray photoelectron spectroscopy (XPS) measurements reveal the presence of Zn2+ and chemisorbed oxygen in ZnO thin films. Atomic force micrograms (AFM) revealed a granular, polycrystalline morphology for the films. The grain size is found to increase as the substrate temperature increases. All films exhibit a transmittance of about 85% in the visible region. The photoluminescence (PL) measurements indicated that the intensity of emission peaks significantly varying with substrate temperature. Electrical resistivity has been found to decrease; while the carrier concentration increases with substrate temperature.
Journal: Physica B: Condensed Matter - Volume 405, Issue 9, 1 May 2010, Pages 2226–2231