A flow model of porous anodic film growth on aluminium

The development of pores in a classical porous anodic film formed on aluminium in phosphoric acid solution is investigated. The study employs a tungsten tracer layer that is incorporated into the anodic film from the aluminium substrate, followed by detection of the tracer by transmission electron microscopy and Rutherford backscattering spectroscopy. Distortions of the tungsten layer on entry into the film and retention of tungsten species in the film are compatible with porosity arising mainly from flow of anodic oxide beneath the pore bases towards the cell walls. The behaviour is contrary to expectations of a dissolution model of pore formation.