کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
195320 459812 2007 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی مهندسی شیمی (عمومی)
پیش نمایش صفحه اول مقاله
High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)
چکیده انگلیسی

With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences. For many of these applications, high resolution is required as the relevant information lies in the sub-microscopic distribution of work functions or potentials, which explains the increasing interest in SKPFM. However, compared to the standard scanning Kelvin probe (SKP) technique SKPFM is prone to much more artefacts, which are often not taken into account in the interpretation of the results, as is also the case with the real physical nature of the measured data. A critical discussion of possible artefacts and on the interpretation of the data is presented in this paper, with the main focus on application in corrosion science.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Electrochimica Acta - Volume 53, Issue 2, 1 December 2007, Pages 290–299
نویسندگان
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