کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
501843 | 863661 | 2011 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
MC-ORACLE: A tool for predicting Soft Error Rate
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Natural radiation is known to be a source of microelectronics failure. For instance, neutrons, protons, heavy ions, and alpha particles have all been implicated in the occurrence of soft errors in memory devices. To predict the reliability of electronics devices we developed a tool called MC-ORACLE. This Monte Carlo application is based on the common empirical soft error criterion for a critical charge deposited in a parallelepiped sensitive volume. MC-ORACLE is able to deal with complex structures composed of various materials. It provides single and multiple error cross sections as well as the soft error rate.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Computer Physics Communications - Volume 182, Issue 2, February 2011, Pages 317–321
Journal: Computer Physics Communications - Volume 182, Issue 2, February 2011, Pages 317–321
نویسندگان
Frédéric Wrobel, Frédéric Saigné,