Keywords: مشاجره تنها رویداد; Low alpha counting; Soft error rate; Cosmic ray; Single event upset;
مقالات ISI مشاجره تنها رویداد (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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Keywords: مشاجره تنها رویداد; Flash memories; Soft error; Single event upset; Neutrons; Alpha particles;
Keywords: مشاجره تنها رویداد; Evolvable hardware; Field programmable gate array; Multi-objective approach; Selective triple modular redundancy; Single event upset
Keywords: مشاجره تنها رویداد; Fault-tolerance; Electro-mechanical systems; Fault injection; Single event upset; Functional verification
Modular fault tolerant processor architecture on a SoC for space
Keywords: مشاجره تنها رویداد; Single event functional interrupt; Single event upset; Error correction; Fault tolerant systems;
Seu and Sefi error detection and correction on a ddr3 memory system
Keywords: مشاجره تنها رویداد; Single Event Functional Interrupt; Single event upset; Error correction; DDR3;
Irradiation setup at the U-120M cyclotron facility
Keywords: مشاجره تنها رویداد; Particle irradiation facility; Radiation hardness; Dosimetry; Single event effect; Single event upset; Single event transient;
Application of SEU imaging for analysis of device architecture using a 25Â MeV/u 86Kr ion microbeam at HIRFL
Keywords: مشاجره تنها رویداد; Heavy-ion microbeam; High-energy; Single event upset; FPGA; Imaging;
A simple analytical model of single-event upsets in bulk CMOS
Keywords: مشاجره تنها رویداد; Single event upset; Analytical models; CMOS; Cross-section; Curve-fitting; Multi-node charge collection; Diffusion charge collection;
Low energy proton induced single event upset in 65Â nm DDR and QDR commercial SRAMs
Keywords: مشاجره تنها رویداد; SRAM; Low energy proton; Single event upset; Direct ionization;
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
Keywords: مشاجره تنها رویداد; Heavy ion irradiation; Single event upset; Active delay element; SRAM cell; Radiation hardened; Silicon-on-insulator;
SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology
Keywords: مشاجره تنها رویداد; Single event upset; Charge sharing; Common centroid layout; Integrated circuit reliability; Quatro; Differential structure;
Single Event Upset rate determination for 65Â nm SRAM bit-cell in LEO radiation environments
Keywords: مشاجره تنها رویداد; Single Event Upset; Soft error rates; Static RAM; Sun-Synchronous LEO; Space radiation environment; Visual TCAD;
Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources
Keywords: مشاجره تنها رویداد; Soft errors; Single event effects; Single Event Upset; Radiation effects; SRAM; Neutrons;
Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS
Keywords: مشاجره تنها رویداد; Charge sharing; Single event double-upset; Single event transient; Single event upset; Radiation hardening;
Silicon nanotube SRAM and its SEU reliability
Keywords: مشاجره تنها رویداد; Heavy ions; SiNT FET; Single event upset; Static noise margin; SRAM; TCAD;
Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants
Keywords: مشاجره تنها رویداد; Configuration Memory; Fault Tolerance; FPGAs; Nuclear Power Plant I&C Systems; Radiation Effects; Single Event Effects; Single Event Upset; SEU Mitigation; Soft Errors; TID Effects;
Effects of voltage stress on the single event upset (SEU) response of 65Â nm flip flop
Keywords: مشاجره تنها رویداد; Voltage stress; Single event upset; Flip flop; 65Â nm; Pulsed laser; Radiation effect; Reliability; Aging; Cross section curve; SEU mapping;
An SEU resilient, SET filterable and cost effective latch in presence of PVT variations
Keywords: مشاجره تنها رویداد; Transient fault; Single event upset; Single event transient; Soft error; Radiation hardening; Circuit reliability
UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs
Keywords: مشاجره تنها رویداد; Single Event Upset; SRAM-based FPGA; Untestability analysis; Model checking
Influence of edge effects on single event upset susceptibility of SOI SRAMs
Keywords: مشاجره تنها رویداد; Single event upset; Edge effects; Sensitive region; CRÈME-MC simulation
Reliability for nanomagnetic logic (NML) readout circuit under single event effect
Keywords: مشاجره تنها رویداد; Nanomagnetic logic (NML); Magnetic-electrical interface; Single event upset; Harden;
UWE-3, in-orbit performance and lessons learned of a modular and flexible satellite bus for future pico-satellite formations
Keywords: مشاجره تنها رویداد; ADCS; attitude determination system; COMM; communication system; COTS; commercial of the shelf; ECI; Earth center inertial; EDAC; error detection and recovery; EPS; electrical power system; FDIR; fault-detection, fault-isolation and recovery; GUI; graphic
A low power-delay-product and robust Isolated-DICE based SEU-tolerant latch circuit design
Keywords: مشاجره تنها رویداد; Soft error; Single event upset; Isolating; DICE; Latch
A new methodology for single event transient suppression in flash FPGAs
Keywords: مشاجره تنها رویداد; Field programmable gate array; Single event transient; Single event upset; Tripple Modular Redundancy; Application Specific Integrated Circuits
Intelligent fault-tolerant control for swing-arm system in the space-borne spectrograph
Keywords: مشاجره تنها رویداد; Transient fault; Fault-tolerant control; Single event upset; Control flow checking; Sliding mode control
First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM
Keywords: مشاجره تنها رویداد; Monolithic Pixel Sensors; Single Event Upset; Ion Electron Emission Microscopy
MC-ORACLE: A tool for predicting Soft Error Rate
Keywords: مشاجره تنها رویداد; Single Event Upset; Soft Error Rate; Sensitive volume; RAM
Soft core based embedded systems in critical aerospace applications
Keywords: مشاجره تنها رویداد; Low-cost satellites; Soft-microprocessors; Fault tolerance; Reliability; Transient fault; Single Event Upset; Soft-error mitigation; Co-design
Soft error modeling and remediation techniques in ASIC designs
Keywords: مشاجره تنها رویداد; Soft error; ASIC design; Fault injection; Combinational logic; Single event upset; Error propagation
The ALICE TPC, a large 3-dimensional tracking device with fast readout for ultra-high multiplicity events
Keywords: مشاجره تنها رویداد; AC; alternating current; ACORDE; ALICE COsmic ray DEtector; ADC; analog to digital converter; ALEPH; apparatus for LEP PHysics; ALICE; a large ion collider experiment; ALTRO; ALICE TPC ReadOut chip; BC; board controller; CAD; computer aided design; CAN; c
Experimental study on heavy ion single event effects in SOI SRAMs
Keywords: مشاجره تنها رویداد; 61.80.Jh; 85.40.VbSOI SRAM; Single event upset; Single event upset rate
Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Keywords: مشاجره تنها رویداد; Silicon-germanium; Radiation effects; Single event upset; Proton; Radiation hardening by design; RHBD; SEU; SiGe HBT;
Ion beam induced charge (IBIC) studies of silicon germanium heterojunction bipolar transistors (HBTs)
Keywords: مشاجره تنها رویداد; 81.05.Hd; 61.80.−x; 81.40.WxIBIC; TRIBIC; SiGe; Radiation effects; Single event upset
Reliability study of bulk and SOI SRAMs using high energy nuclear probes
Keywords: مشاجره تنها رویداد; 85.30.De; 85.40.Qx; 85.40.âe; 73.50.Gr; Silicon-on-insulator; Floating body effect; Reliability; Body-tie; Single event upset; Nuclear microprobe;
Radiation effects microscopy for failure analysis of microelectronic devices
Keywords: مشاجره تنها رویداد; 85.40.âe; 85.40.âbh; 61.80.âjh; Radiation effects microscopy; Single event upset; Radiation hardened ICs;