Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis

Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy - Volume 135, 1 September 2017, Pages 22-28

H. Rotella, B. Caby, Y. Ménesguen, Y. Mazel, A. Valla, D. Ingerle, B. Detlefs, M.-C. Lépy, A. Novikova, G. Rodriguez, C. Streli, E. Nolot,