Keywords: GIXRF; XRR; XPS; Mass spectrometry; Tellurium; Thin films;
مقالات ISI (ترجمه نشده)
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Keywords: X-ray reflectivity; Polarized neutron reflectivity; Interdiffusion; Self-diffusion; Intermetallic alloy phases; Annealing; Diffusion length; Solid state reaction; Activation energy for diffusion; Ni/Al, Ni/Ti and Ni/Ge multilayers; XRD; X-ray diffraction;
Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis
Keywords: GIXRF; XRR; Depth profiling; Transparent conducting oxides;
Keywords: Lithium-ion battery; Surface structure; Electronic structure; Electrode-electrolyte interface; ABF; annular bright field; AFM; atomic force microscopy; AM; amplitude modulation; EC; ethylene carbonate; CVD; chemical vapor deposition; DEC; diethyl carbonat
Keywords: HWCVD; SiOC:H; Ellipsometric porosimetry; FTIR; XRR; SIMS; Porous ultra low-k
Keywords: Plasma polymerisation; Thin films; Swift heavy ions; XRR; Ellipsometry;
Keywords: CVD; chemical vapor deposition; ALD; atomic layer deposition; XRR; X-ray reflection; SEM; scanning electron microscopy; FIB; focused ion beam; XRD; X-ray diffraction; Instrumented nano-indentation; Metal oxide nano-laminates; Mechanical properties; Thin f
Keywords: GIXRF; XRR; Ultra-shallow junctions; Ultra-shallow implants;
Structural and optical properties of two-dimensional gadolinium stearate Langmuir monolayer
Keywords: Langmuir monolayer; Assembly; Liquid-air interface; Surface pressure; XRR; GID;
Structural and optical properties of optimized amorphous GeTe films for memory applications
Keywords: Phase change materials; Amorphous GeTe; Spectroscopic ellipsometry; XRD; XRR;
Nanoscale structural damage due to focused ion beam milling of silicon with Ga ions
Keywords: Ga-ion amorphisation; XRR; Eigenstrain;
Evolution of LiFePO4 thin films interphase with electrolyte
Keywords: Electrode/electrolyte interface; Lithium batteries; Model surface; XPS; XRR;
Analysis of organic multilayer structures using a combined grazing incidence X-ray fluorescence/X-ray reflectometry approach
Keywords: OLED; GIXRF; XRR; Organic thin films; Thin film characterization;
Structural, optical and electrical properties of crystalline V2O5 films deposited by thermal evaporation and effects of temperature on UV-vis and Raman spectra
Keywords: 78.20.Nv; 61.10.Kw; 61.10.Nz; 78.20.-e; 33.20.Fb; V2O5 thin films; Thermo-optical effect; XRR; GIXRD; Optical properties; Raman spectra;
Investigation of local structural and magnetic properties of discontinuous to continuous layer of Co at Co/MgO interface in MgO/Co/MgO trilayer structure
Keywords: Magnetic tunneling junction; XRR; XAS; XAFS; Interface modification; Magnetization; Oxide migration;
Structural analysis of amorphous carbon films by BEMA theory based on spectroscopic ellipsometry measurement
Keywords: Amorphous carbon film; Structural analysis; BEMA theory; NEXAFS; XRR;
Be/W and W/Be bilayers deposited on Si substrates with hydrogenated Fe-Cr and Fe-Cr-Al interlayers for plasma facing components
Keywords: Plasma facing components; Be/W and W/Be bilayers; Atomic interdiffusion; XPS; CEMS; GIXRD; XRR;
JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants
Keywords: GIXRF; XRR; Depth profiling; Nanometer layer characterization;
Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis
Keywords: XRR; GIXRF; Depth-profiling; Thin layer characterization
An in-situ X-ray diffraction study on the electrochemical formation of PtZn alloys on Pt(1Â 1Â 1) single crystal electrode
Keywords: Pt; Zn; Alloy; XRD; XRR; Electrochemistry;
Thickness dependence of the porosity of PPy/DDS films
Keywords: Polypyrrole; Dodecylsulfate; Porosity; GISAXS; XRR; AFM;
Ion beam studies of Hafnium based alternate high-k dielectric films deposited on silicon
Keywords: High-k dielectrics; MOS devices; SHI; HRBS; XRR;
Effect of interface on magnetic properties of Co20Fe60B20 in ion-beam sputtered Si/CoFeB/MgO and Si/MgO/CoFeB bilayers
Keywords: In-plane magnetic anisotropy; Interface; Roughness; XRR;
Accurate stopping power determination of 15N ions for hydrogen depth profiling by a combination of ion beams and synchrotron radiation
Keywords: Nuclear reaction analysis; Hydrogen depth profiling; Stopping cross section; Linear energy transfer; Synchrotron radiation; XRR;
Double layer structure of ZnO thin films deposited by RF-magnetron sputtering on glass substrate
Keywords: ZnO thin films; Magnetron sputtering; Interface; VRH mechanism; XRR;
Structural analysis of PTCDA monolayers on epitaxial graphene with ultra-high vacuum scanning tunneling microscopy and high-resolution X-ray reflectivity
Keywords: XRR; STM; PTCDA; Epitaxial graphene; Silicon carbide;
Structural and magnetic study of swift heavy ion irradiated W/Fe multilayer structure
Keywords: W/Fe MLS; Swift heavy ion irradiation; X-TEM; VSM; XRR
Thermal and irradiation induced interdiffusion in Fe3O4/MgO(0 0 1) thin film
Keywords: 68.47.Gh; 68.49.Sf; 81.15.Hi; 61.05.cmRBS; Channeling; MBE; CEMS; XRR; Magnetite Fe3O4
The role of etched silicon channels on the pore ordering of mesoporous silica: The importance of film thickness on providing highly orientated and defect-free thin films
Keywords: Mesoporous silica; Thin films; Confining architectures; SAXS; XRR;
Evaluation of plasma damage in ultra-low-k materials with cap film using “extracted k-value” method
Keywords: Plasma damage; XRR; Cap deposition; Extracted k-value; k-Value extraction; Dielectrics; Low k
X-ray metrology for high-k atomic layer deposited HfxZr1âxO2 films
Keywords: High-k; Hafnium; Zirconium; ALD; X-ray; XRR; Metrology;
The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin
Keywords: Thin film; XRR; Round-robin; VAMAS; Prenormative research;
Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques
Keywords: Thin films; SrZrO3; Perovskite; XRR; SIMS; FTIR
Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica
Keywords: XRR; Thin films; Nanofilms; X-ray reflectometry; Mica; Surface-grown polymer brushes; Surface characterisation
Surface morphology and the phase formation at Cr/Si system
Keywords: Solid state mixing; Metal silicide; Nanorods; GIXRD; XRR; AFM;
Structural study of nanoporous ultra low-k dielectrics using complementary techniques: Ellipsometric porosimetry, X-ray reflectivity and grazing incidence small-angle X-ray scattering
Keywords: 61.10.e; 61.18.j; 61.72.Dd; 61.82.Ms; 68.55.a; Porous ultra low k dielectrics; Materials for microelectronics; Structural determination; GISAXS; XRR; Ellipsometric porosimetry;
SAXS analysis of the effect of H2 dilution on microstructural changes of HWCVD deposited a-SiC : H
Keywords: a-SiC : H; Microstructure; SAXS; XRR; HWCVD deposition
Diffusion behaviour of Nb in yttria-stabilized zirconia single crystals: A SIMS, AFM and X-ray reflectometry investigations
Keywords: 68.60.Dv; 68.35.Fx; YSZ; Nb diffusion; SIMS; XRR; AFM;
Study of thermal stability of nickel silicide by X-ray reflectivity
Keywords: NiSi; Silicide; XRR; Density;
Sol-gel synthesis and characterization of lamellar mesostructured titania films
Keywords: Mesostructured titania; Lamellar films; XRR; XRD2;
Solid phase crystallisation of HfO2 thin films
Keywords: Thin films; HfO2; Spectroscopic ellipsometry; XRD; XRR; AFM;
Characterization of atomic layer deposited nanoscale structure on dense dielectric substrates by X-ray reflectivity
Keywords: XRR; Density; ALD; Dielectrics;
Rutherford backscattering and X-ray reflectivity analysis of tunnel barriers
Keywords: 82.80.Yc; 61.10.Kw; 68.55.Nq; 73.40.Qv; RBS; XRR; Tunnel junctions; Spintronic materials;
High-resolution XRD characterization of SiGeC structures for high frequency microelectronics applications
Keywords: XRD; XRR; Epitaxial layer; SiGe HBT; AES; SIMS; Spectroscopic ellipsometry; TEM;
Thin films of mesoporous silica: characterization and applications
Keywords: Mesoporous film; Silica; XRR; GIXD; Low-k; Photoluminescence; Films mésoporeux; Silice; XRR; GIXD; Faible k; Photoluminescence;