کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5141539 1645379 2017 32 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Analytical requirements for quantitative X-ray fluorescence nano-imaging of metal traces in solid samples
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
Analytical requirements for quantitative X-ray fluorescence nano-imaging of metal traces in solid samples
چکیده انگلیسی
Quantitative nano-imaging of metal traces in a solid is a recent capability arising from the construction of hard X-ray nanoprobes dedicated to X-ray Fluorescence (XRF) imaging on upgraded third generation synchrotrons. Micrometer sample preparation valid for trace analysis is a fundamental part of the required developments to capitalize on the reduced Minimum Detection Limits. Practical guidelines lead us to propose a customized use of Focused Ion Beams (FIB) backed by state of the art Monte Carlo XRF modeling to initiate preparations of new samples and certified standards. The usefulness of these developments is illustrated by the first detection of Ni traces (4.57E+07 ± 3.2E+06 (7.1%) at μm−3) in a 3.35 Ga old microstructure of putative microbial origin from Barberton (South Africa). A list of feasibility checks provides a way of getting below 5 ppm MDLs for acquisition-times of 10 s with an analytical precision better than 10%.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: TrAC Trends in Analytical Chemistry - Volume 91, June 2017, Pages 104-111
نویسندگان
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