کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5395843 | 1505734 | 2014 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Multilayer reflectometry and quantitative analysis of higher order diffraction impurities of grating monochromator
ترجمه فارسی عنوان
بازتابی چند لایه و تجزیه و تحلیل کمی از ناخالصی های پراکندگی مرتبه ترانزیستور تک رنگ
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کلمات کلیدی
اشعه ایکس نرم، چند لایه، بازتاب سنجی، پراش مرتبه بالاتر،
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
چکیده انگلیسی
Spectral impurity of the beam delivered by a soft X-ray synchrotron beamline is often a problem because higher order components of a grating monochromator cause some error in quantitative measurements. To achieve a correct data analysis, characterization of the higher order diffraction impurities is needed. This paper describes a simple and easy method, where a reflective multilayer is used to pick one out of a series of diffraction orders with the angle of incidence adjusted. The reflectance of the multilayer is first measured at harmonic energies 2E, 3E and 4E at an angle of incidence Ïn satisfying the Bragg condition in the first order, where E is the fundamental energy. Then, setting sequentially the angle of incidence of the multilayer at Ïn, reflectance is measured around E, where the measured value is reflectance for the energy nE multiplied by the proportion of the nth order component. Thus, impurity spectrum is obtained. The present method can be generally used for any beamline and any energy. Experiments were performed at BL-11D of the Photon Factory, KEK, at 282Â eV using a Cr/C multilayer, and the proportion of the first order was found to be 0.915. The normal incidence reflectance of the multilayer was measured, and the intrinsic value for pure 282Â eV light was estimated to be 20.4% by purity factor correction.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 196, October 2014, Pages 156-158
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 196, October 2014, Pages 156-158
نویسندگان
Tadashi Hatano, Tetsuo Harada,