کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396584 | 1505759 | 2010 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Chemically resolved electrical measurements in organic self-assembled molecular layers
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Chemically resolved electrical measurements in organic self-assembled molecular layers Chemically resolved electrical measurements in organic self-assembled molecular layers](/preview/png/5396584.png)
چکیده انگلیسی
The spectroscopy of charged particles, e.g. X-ray photoelectron spectroscopy (XPS), proposes unique capabilities for electrical studies of nanometric heterostructures. By turning the problem of surface charging into a consistent and general method for chemically resolved electrical measurements (CREM), selected surface and sub-surface regions can be probed in a non-contact manner, with useful advantages over standard electrical tools. When applied to organic systems, CREM can read electrical information out of atomic sites within molecular assemblies, and hence, map the electrostatic potential variations under external stimuli, approaching atomic resolution. This paper reviews CREM studies of self-assembled monolayers (SAMs), with an emphasis on questions regarding the surface charge distribution. Surprising observations in work function changes under self-assembly of dipolar molecules are presented, as well as the direct detection of sub-molecular polarization effects, and photo-induced charge redistribution across SAMs that are situated between semiconducting media. The review concludes by suggesting future applications of CREM and further challenges that may arise.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 176, Issues 1â3, January 2010, Pages 24-34
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 176, Issues 1â3, January 2010, Pages 24-34
نویسندگان
Hagai Cohen,