کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396648 | 1505757 | 2010 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32 X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32](/preview/png/5396648.png)
چکیده انگلیسی
Investigations on the geometrical structure, chemical composition and electronic properties of surfaces and interfaces are performed on beamline ID32 at the ESRF. It is a high resolution beamline covering the photon energy range 1.4-30Â keV optimized for X-ray standing wave, surface X-ray diffraction, and hard X-ray photoelectron spectroscopy experiments. Fresnel zone plates and compound refractive lens systems are used to focus the monochromatic beam. After outlining the principles of X-ray standing wave measurements the unique features of the ID32 beamline are described. Future developments are discussed and finally some selected examples illustrating the advantages of combining the X-ray standing wave technique with hard X-ray photoelectron spectroscopy are presented.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 258-267
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 258-267
نویسندگان
Jörg Zegenhagen, Blanka Detlefs, Tien-Lin Lee, Sebastian Thiess, Helena Isern, Lucien Petit, Lionel André, Jérôme Roy, Yanyu Mi, Isabelle Joumard,