کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396648 | 1505757 | 2010 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Investigations on the geometrical structure, chemical composition and electronic properties of surfaces and interfaces are performed on beamline ID32 at the ESRF. It is a high resolution beamline covering the photon energy range 1.4-30Â keV optimized for X-ray standing wave, surface X-ray diffraction, and hard X-ray photoelectron spectroscopy experiments. Fresnel zone plates and compound refractive lens systems are used to focus the monochromatic beam. After outlining the principles of X-ray standing wave measurements the unique features of the ID32 beamline are described. Future developments are discussed and finally some selected examples illustrating the advantages of combining the X-ray standing wave technique with hard X-ray photoelectron spectroscopy are presented.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 258-267
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 258-267
نویسندگان
Jörg Zegenhagen, Blanka Detlefs, Tien-Lin Lee, Sebastian Thiess, Helena Isern, Lucien Petit, Lionel André, Jérôme Roy, Yanyu Mi, Isabelle Joumard,