Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Lithium-ion battery; Surface structure; Electronic structure; Electrode-electrolyte interface; ABF; annular bright field; AFM; atomic force microscopy; AM; amplitude modulation; EC; ethylene carbonate; CVD; chemical vapor deposition; DEC; diethyl carbonat
مقالات ISI طیف سنجی فوتوالکترون اشعه ایکس سخت (ترجمه نشده)
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Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Gold nanoparticles; Transmission electron microscopy; Valence band; Support effect; Titanium dioxide; Hard X-ray photoelectron spectroscopy;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photoemission; Imaging; PEEM; Time resolved; Spin resolved; ToF momentum microscope; Spin filter; 2PPE; two-photon photoemission; ARPES; angular resolved photoemission spectroscopy; BBO; beta-barium borate; BFP; backfocal plane; CCD; charge-coupled device
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photoelectron; Angular distribution; Non-dipole approximation; Hard X-ray photoelectron spectroscopy;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard x-ray photoelectron spectroscopy; Electrical characterisation; X-ray photoelectron spectroscopy; Surface passivation;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; Nb hydrides; Nb 2p spectra; Valence-band spectra; Chemical shifts;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Nickel; Photoionization cross section; Hard X-ray photoelectron spectroscopy; HAXPES; HIKE;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; Electronic band line-up; Electrical properties; Functional multilayered structures; Non-volatile memory devices;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; HAXPES; Bulk-sensitive electronic structure; Functional materials; Buried interfaces;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; 79.60.Jv; 71.20.Be; 73.20.âr; Hard X-ray photoelectron spectroscopy; Materials for energy; Bulk properties; Multilayers; Interface properties; Alloying; Electronic structure;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; HAXPES; Circular magnetic dichroism; Angular resolved photoelectron spectroscopy;
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; HAXPES; Linear dichroism in angular distribution; Heusler compounds;
Surface modification of iron oxides by ion bombardment - Comparing depth profiling by HAXPES and Ar ion sputtering
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; Depth profiling; Iron oxide; HAXPES; Synchrotron radiation;
Chemical form analysis of reaction products in Cs-adsorption on stainless steel by means of HAXPES and SEM/EDX
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; FP transport; Cesium; Adsorption; Chemical form; Hard X-ray photoelectron spectroscopy;
Dirac-Fock photoionization parameters for HAXPES applications
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photoionization cross section; Photoelectron angular distribution; Hard X-ray photoelectron spectroscopy; Dirac-Fock method;
Study on electroluminescence from multiply-stacking valency controlled Si quantum dots
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Silicon; Quantum dots; Low pressure chemical vapor deposition; Hard X-ray photoelectron spectroscopy; Electroluminescence
Improving cycling performance of Li-rich layered cathode materials through combination of Al2O3-based surface modification and stepwise precycling
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Lithium secondary battery; Surface modification; Li-rich layered oxide; Hard X-ray photoelectron spectroscopy
Chemical characterization of surface precipitates in La0.7Sr0.3Co0.2Fe0.8O3-δ as cathode material for solid oxide fuel cells
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Solid oxide fuel cells; Strontium doped lanthanum cobalt ferrite; Strontium surface segregation; Transmission electron microscope; Total reflection X-ray fluorescence; Hard X-ray photoelectron spectroscopy;
A hard X-ray photoelectron spectroscopy study on the solid electrolyte interphase of a lithium 4,5-dicyano-2-(trifluoromethyl)imidazolide based electrolyte for Si-electrodes
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Lithium 4,5-dicyano-2-(trifluoromethyl)imidazolide; Silicon negative electrode; Solid electrolyte interphase; Hard x-ray photoelectron spectroscopy;
Quantitative study of the f occupation in CeMIn5 and other cerium compounds with hard X-rays
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Heavy fermion; Valence; Hard X-ray photoelectron spectroscopy; L-edge X-ray absorption; Full multiplet; Single impurity Anderson model;
Development of hard X-ray photoelectron SPLEED-based spectrometer applicable for probing of buried magnetic layer valence states
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photoelectron spectroscopy; Hard X-ray photoelectron spectroscopy; Electronic structure; Magnetic tunnel junctions; Spin-resolved photoemission;
The valence band electronic structure of rhombohedral-like and tetragonal-like BiFeO3 thin films from hard X-ray photoelectron spectroscopy and first-principles theory
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; 79.60.Jv; 71.20.Be; 73.20.âr; Hard X-ray photoelectron spectroscopy; Multifunctional materials; Multiferroics; Electronic structure; Density functional theory; Bismuth ferrite;
Locally resolved investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition using hard X-ray photoelectron and X-ray fluorescence spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photovoltaics; Chalcopyrite; Copper indium gallium senelide; Physical vapor deposition; Hard X-ray photoelectron spectroscopy;
Phase control of iron oxides grown in nano-scale structures on FTO and Si(100): Hematite, maghemite and magnetite
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; HAXPES; Hematite; Thin films; Pulsed chemical vapour deposition; PEC
Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (MÂ =Â Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Heavy fermion; Valence fluctuation; Hard X-ray photoelectron spectroscopy; Plasmon; Full multiplet; Single impurity model;
Investigation of Cu-poor and Cu-rich Cu(In,Ga)Se2/CdS interfaces using hard X-ray photoelectron spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Chalcopyrite; Hard X-ray photoelectron spectroscopy; Cd diffusion; Interface;
HAXPES studies of solid materials for applications in energy and information technology using the HIKE facility at HZB-BESSY II
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photoelectron spectroscopy; Hard X-ray photoelectron spectroscopy; HAXPES; HIKE; ESCA;
Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Multilevel resistive switching; Memristor; Hard X-ray photoelectron spectroscopy; Oxygen vacancies; HfxAl1−xOy; Potential distribution
Photoelectron spectroscopic study on band alignment of poly(3-hexylthiophene-2,5-diyl)/polar-ZnO heterointerface
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; Organic/inorganic interface; Zinc oxide; Polymer semiconductor; Band alignment; Photovoltaic device
An HAXPES study of Sn, SnS, SnO and SnO2
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; Sn; Metal; Oxides; Sulphide; HAXPES; Synchrotron radiation; SnO; SnO2; SnS;
Analysis of hard carbon for lithium-ion batteries by hard X-ray photoelectron spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Lithium-ion battery; Hard carbon; Lithium insertion; X-ray photoelectron spectroscopy; Hard X-ray photoelectron spectroscopy; Nuclear magnetic resonance;
X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Sr-rich SrTiO3 thin layers; Ultra-thin interfacial layers; Nondestructive investigation techniques; Hard X-ray Photoelectron Spectroscopy; Depth Resolved Soft X-ray Emission Spectroscopy; Soft X-ray Reflection Spectroscopy;
Interface exchange coupling in a CoPt/NiO bilayer
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Magnetic exchange coupling; Interface effects; Exchange bias; Hard X-ray Photoelectron Spectroscopy; Cobalt-platinum alloy; Coercivity enhancement; Pulsed Laser Deposition;
Practical chemical analysis of Pt and Pd based heterogeneous catalysts with hard X-ray photoelectron spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray photoelectron spectroscopy; Heterogeneous catalyst; Porous catalyst; Trace element analysis;
Plasma interaction with Zn nano layer on organic materials for analysis of early stage of inorganic/organic hybrid multi-layer formation
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low-inductance antenna; Polymer; Low-damage process; Hard X-ray photoelectron spectroscopy
Synchrotron radiation photoelectron spectroscopy study of metal-oxide thin film catalysts: Pt-CeO2 coated CNTs
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Cerium oxide; Platinum; Magnetron sputtering; Hard X-ray photoelectron spectroscopy;
Investigation of chemical bonding states at interface of Zn/organic materials for analysis of early stage of inorganic/organic hybrid multi-layer formation
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low-inductance antenna; Polymer; Low-damage process; Hard X-ray photoelectron spectroscopy;
Hard X-ray photoemission spectroscopy: Variable depth analysis of bulk, surface and interface electronic properties
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Hard X-ray Photoelectron Spectroscopy; Bulk properties;
Effects of photoirradiation in UV and VUV regions during plasma exposure to polymers
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low-inductance antenna; Polymer; Low-damage process; Hard X-ray photoelectron spectroscopy
Plasma processing of soft materials for development of flexible devices
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low inductance antenna; Low-damage process; Organic–inorganic device; Hard X-ray photoelectron spectroscopy; X-ray photoelectron spectroscopy
Fe3O4 on ZnO: A spectroscopic study of film and interface properties
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Magnetite; Zinc oxide; Iron oxide; Photoemission; Low energy electron diffraction; X-ray Photoelectron Spectroscopy; X-ray magnetic circular dichroism; Hard X-ray Photoelectron Spectroscopy
Polarity of heavily doped ZnO films grown on sapphire and SiO2 glass substrates by pulsed laser deposition
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Zinc oxide; Glass substrate; Crystalline polarity; Hard X-ray photoelectron spectroscopy; Doping
Electronic structural analysis of transparent In2O3–ZnO films by hard X-ray photoelectron spectroscopy
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Transparent conductive oxide; Indium zinc oxide; Hard X-ray photoelectron spectroscopy
Characterization of flatband voltage roll-off and roll-up behavior in La2O3/silicate gate dielectric
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; High-k gate dielectric; Lanthanum oxide; Silicate; Hard X-ray photoelectron spectroscopy
Low-damage plasma processing of polymers for development of organic-inorganic flexible devices
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low inductance antenna; Low-damage process; Organic-inorganic device; Hard x-ray photoelectron spectroscopy;
Low-damage surface modification of polymethylmethacrylate with argon–oxygen mixture plasmas driven by multiple low-inductance antenna units
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low-inductance antenna; Polymer; PMMA; Low-damage process; Hard X-ray photoelectron spectroscopy
Fabrication and hard X-ray photoemission analysis of photocathodes with sharp solar-blind sensitivity using AlGaN films grown on Si substrates
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Photocathode; III-V nitride; Hard X-ray photoelectron spectroscopy;
X-ray photoelectron spectroscopy for analysis of plasma–polymer interactions in Ar plasmas sustained via RF inductive coupling with low-inductance antenna units
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Inductively-coupled plasma; Low-inductance antenna; Plasma–polymer interactions; PMMA; Ar plasma; Low-damage process; Hard X-ray photoelectron spectroscopy; XPS
Non-destructive compositional depth profile in the tens-of-nanometer scale
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; Depth profile; Hard X-Ray Photoelectron Spectroscopy; Synchrotron radiation;
X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32
Keywords: طیف سنجی فوتوالکترون اشعه ایکس سخت; X-ray standing waves; Hard X-ray photoelectron spectroscopy; Synchrotron radiation; Photoelectric multipole contributions; Fourier analysis;