کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7839362 1505707 2018 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Surface modification of iron oxides by ion bombardment - Comparing depth profiling by HAXPES and Ar ion sputtering
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Surface modification of iron oxides by ion bombardment - Comparing depth profiling by HAXPES and Ar ion sputtering
چکیده انگلیسی
Thin films of the iron oxide maghemite (γ-Fe2O3) and hematite (α-Fe2O3) grown on fluorine doped tin oxide (FTO) with pulsed chemical vapour deposition have been investigated with hard X-ray photoelectron spectroscopy. It is found that even low energy sputtering induces a reduction of the surface layer into FeO. Satellites in the Fe 2p core level spectra are used to determine the oxidation state of iron. Depth profiling with changing photon energy shows that the unsputtered films are homogeneous and that the information obtained from sputtering thus, in this instance, represents sputter damages to the sample.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 224, April 2018, Pages 23-26
نویسندگان
, , , ,