X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 109, September 2013, Pages 13-16

E.O. Filatova, I.V. Kozhevnikov, A.A. Sokolov, Yu V. Yegorova, A.S. Konashuk, O.Yu Vilkov, F. Schaefers, M. Gorgoi, A.S. Shulakov,