کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396776 | 1505765 | 2009 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Beam-induced effects in soft X-ray photoelectron emission microscopy experiments
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Beam-induced effects in soft X-ray photoelectron emission microscopy experiments Beam-induced effects in soft X-ray photoelectron emission microscopy experiments](/preview/png/5396776.png)
چکیده انگلیسی
The beam-induced effects, a consequence of the high photon flux density used in soft X-ray photoelectron emission microscopes in operation at the 3rd generation synchrotron sources, are discussed and illustrated using some representative results obtained with the microscopes at the laboratory Elettra. The focus is on the photon-induced charge potential and chemical degradation, which might be a severe problem for photon-sensible specimens. The possible steps to avoid, reduce or even make use of the beam-induced effects are outlined.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 170, Issues 1â3, March 2009, Pages 13-18
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 170, Issues 1â3, March 2009, Pages 13-18
نویسندگان
L. Gregoratti, T.O. Mentes, A. Locatelli, M. Kiskinova,