Characterization of the photo-irradiation effects on polystyrene ultrathin films with ultraviolet photoemission spectroscopy

The synchrotron-radiation-induced structural degradation in polystyrene thin films was analyzed by comparing measured ultraviolet photoemission spectroscopy (UPS) spectra with model molecular orbital calculations. The analysis confirms degradation of the phenyl pendant groups and the generation of conjugated double-bonds in the degraded polymer. The observed degradation in polystyrene is found to be very similar to one from polyethylene previously investigated.