کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
539726 1450393 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Experimental and simulation study of the effect of pipette roughness on giga-seal formation in patch clamping
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Experimental and simulation study of the effect of pipette roughness on giga-seal formation in patch clamping
چکیده انگلیسی

The effect of pipette tip roughness on giga-seal formation of patch clamp recording has been studied through FEA simulation and patch clamp experiments. FEA simulation results show that the membrane cannot fill up all of the peaks and valleys of a rough pipette tip. As a result in three dimensions the seal between inside and outside is compromised by channels in the order of several nanometres. These channels increase the leakage current between two electrodes, increase the noise and decrease the seal resistance. In contrast focused-ion-beam polished pipettes have very flat tips. Single ion channel currents recorded by FIB polished pipettes show significantly smaller leakage current and noise than the currents recorded by conventional pipettes. Results of FEA simulation are consistent with the results of patch clamp experiments.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 87, Issues 5–8, May–August 2010, Pages 778–781
نویسندگان
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