کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
539860 871275 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Microwave characterization of porous SiOCH permittivity after integration dedicated to the 32 nm node
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Microwave characterization of porous SiOCH permittivity after integration dedicated to the 32 nm node
چکیده انگلیسی

New porous ULK materials are now required for maintaining a constant RC factor as back-end dimensions shrink for each new technology node. Porous SiOCH ULK HF characterization, dedicated to the 32 nm node, has been performed, and its complex permittivity extracted up to 8 GHz. The impact of process integration on the porous SiOCH is highlighted, by an increase of its real permittivity and unwanted losses.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 87, Issue 3, March 2010, Pages 329–332
نویسندگان
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