Correlation between structural changes and luminescent properties of ZnMgS:Mn thin film phosphor with annealing temperature

It was revealed that changes of the luminescent properties were originated from structural changes in Zn0.75Mg0.25S:Mn thin film phosphor from cubic to hexagonal phases using X-ray pole figure mapping, and the growing up of hexagonal phase mainly caused cracks and porous morphology on the surface of thin films. It is suggested that the phase transition would be the origin of luminescent property changes with respect to rapid thermal annealing temperature.