کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
540365 871311 2011 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
EWOD-based chip characterization under AC voltage
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
EWOD-based chip characterization under AC voltage
چکیده انگلیسی

This paper addresses one basic issue of EWOD chip as a consumable: how to detect the alteration of hydrophobic layers? We investigate the possibility of using droplet oscillations to finely characterize chip ability to EWOD protocols. Experiments are performed in coplanar electrodes configuration. Dedicated setup and software have been developed for a simple in situ characterization. When a low-frequency AC voltage is used, drop surface oscillations are created from the time-varying component of the normal electrostatic stress at drop surface near the contact line. As an analysis tool, our software is based on droplet contour detection and delivers dynamical contact angle and contact line motion. Careful attention is brought to surface wetting or dewetting of the droplet during long-term AC actuation and surface ageing.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 88, Issue 8, August 2011, Pages 1745–1748
نویسندگان
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