کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
540537 871316 2011 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Charge trapping in substoichiometric germanium oxide
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Charge trapping in substoichiometric germanium oxide
چکیده انگلیسی

Electron and hole trapping in substoichiometric germanium oxides are investigated through the use of hybrid density functionals. We consider disordered model structures generated by Monte-Carlo bond switching and by ab initio molecular dynamics (MD). The Monte-Carlo model consists of fourfold coordinated Ge atoms and of twofold coordinated O atoms, and does not show trap levels neither for electron nor for holes. At variance, the MD model shows threefold coordinated O and Ge atoms forming valence alternation pairs and is found to present trap states for both carriers. The trapping states correspond to the formation and breaking of Ge–Ge bonds. The associated defect levels are determined within a band diagram of the Ge/GeO2 interface.

Electron and hole trapping in substoichiometric germanium oxides are investigated through the use of hybrid density functionals and found to correspond to the formation and breaking of GeGe bonds.Figure optionsDownload as PowerPoint slideHighlights
► We investigate charge trapping in substoichiometric germanium oxides.
► Valence alternation pairs are found to present trap states for electrons and holes.
► The trapping states correspond to the formation and breaking of Ge–Ge bonds.
► The defect levels are determined within a band diagram of the Ge/GeO2 interface.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 88, Issue 7, July 2011, Pages 1428–1431
نویسندگان
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