Keywords: تله شارژ; Floating gate; Charge trapping; Endurance degradation; Equivalent transistor; NVM;
مقالات ISI تله شارژ (ترجمه نشده)
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Keywords: تله شارژ; Plasma process induced damage; fWLR fast wafer level reliability monitoring; Charge trapping; MOS gate oxide; Device reliability; Hot carrier stress; Bias temperature stress;
Keywords: تله شارژ; Gate-induced drain leakage; Off-state stress; Charge trapping; Defect creation; Polycrystalline silicon thin-film transistor;
Keywords: تله شارژ; Alumina based ceramics; Surface potential decay; Charge trapping; Grain boundaries;
Keywords: تله شارژ; Memory; Charge trapping; WORM; SRAM;
Keywords: تله شارژ; Flash memory; SuperFlash; Non-volatile memory; Floating gate; Hot electron; Oxide degradation; Charge trapping; Single electron;
Keywords: تله شارژ; Charge trapping; Flash memory; X-ray irradiation; Charge loss; X-ray fluorescence;
Keywords: تله شارژ; Plasma process induced damage; Device reliability; Charge trapping; MOS gate oxide; Hot carrier stress; fWLR fast wafer level reliability monitoring;
Keywords: تله شارژ; Organic Zener diodes; p-i-n junction; Charge trapping; Molecular doping; Mott-Schottky relation;
Keywords: تله شارژ; a-Si:H TFTs; Photo-induced instability; Phase transition; Charge trapping; Defect-states creation
Keywords: تله شارژ; Fusion excitation function; Microchannel plate detector; Charge trapping; Segmented silicon detectors; Detection of low energy heavy ions; Measuring reactions with low intensity beams;
Keywords: تله شارژ; Organic bistable devices; Organic memories; Non-volatile memories; Nanoparticles; Charge trapping; Organic device modeling;
Keywords: تله شارژ; DITS; Polymer film; Charge trapping; DOS; Gaussian disorder; Exponential tail
Keywords: تله شارژ; Nanocrystal memory; Charge trapping; Memory window; Unipolar recharging;
Keywords: تله شارژ; Device characterization; Gate-controlled-diode measurement; Charge trapping; MOS devices
Threshold-voltage shift model based on electron tunneling under positive gate bias stress for amorphous InGaZnO thin-film transistors
Keywords: تله شارژ; Thin-film transistor; Electron tunneling; Vth instability; Charge trapping;
FET-based radiation sensors with Er2O3 gate dielectric
Keywords: تله شارژ; Erbium oxide (Er2O3); High-k materials; Irradiation effects; Gamma-ray; Charge trapping; pMOS dosimeters;
Electron extraction mechanism in low hysteresis perovskite solar cells using single crystal TiO2 nanorods
Keywords: تله شارژ; Perovskite solar cells; Hysteresis; TiO2 nanorod; Charge trapping; Ion accumulation;
Electrochemical behavior of poly-bithiophene, poly-3,4-ethylendioxythiophene and poly-3,4-ortho-xylendioxythiophene in EtOH/H2O (1:1) mixture
Keywords: تله شارژ; Conducting polymers; Solvent effect; Cyclic voltammetry; Charge trapping; Chronoamperometry; EtOH/H2O media; Anodic stripping voltammetry;
Electrochemical polymerization, characterization and in-situ conductivity studies of poly-3,4-ortho-xylendioxythiophene (PXDOT)
Keywords: تله شارژ; Conducting polymers; In-situ conductance-electrochemical analysis; 3, 4-dialkoxythiophenes; Ï-dimers; Charge trapping;
Microstructure and charge trapping in ZrO2- and Si3N4-based superlattice layer systems with Ge nanoparticles
Keywords: تله شارژ; Germanium; Nanocrystals; Zirconium oxide; Silicon nitride; Superlattice; Flash lamp annealing; Charge trapping;
The electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress
Keywords: تله شارژ; Electron trap in gate insulator; Parameter extraction; IGZO TFT; PBTS instability; Charge trapping; Activation energy;
Effects of structure and oxygen flow rate on the photo-response of amorphous IGZO-based photodetector devices
Keywords: تله شارژ; Amorphous-IGZO (a-IGZO) photodetector; Structure dependence; Oxygen flow rate (OFR) dependence; Persistent-photoconductivity (PPC); Sub-gap density-of-states (DOS); Oxygen vacancy (VO) ionization; Charge trapping; Threshold voltage (VT) decomposition;
Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence
Keywords: تله شارژ; Charge trapping; RTN; Bias temperature instability; NBTI; PBTI; DFT; Charge transfer reactions;
Defect correlated with positive charge trapping in functional HfO2 layers on (100)Si revealed by electron spin resonance: Evidence for oxygen vacancy?
Keywords: تله شارژ; High-k dielectric; Si/hafnia structure; Charge trapping; Oxygen vacancy; ESR;
Exciton dynamics in cation-exchanged CdSe/PbSe nanorods: The role of defects
Keywords: تله شارژ; Cation exchange; Defect; Charge trapping; Heterostructures; Nanorods;
Suppressed charge trapping characteristics of (NH4)2Sx passivated GaN MOS device with atomic layer deposited HfAlOx gate dielectric
Keywords: تله شارژ; Sulfur passivation; Interface trap density; Charge trapping; GaN device;
Effect of thermal annealing sequence on the crystal phase of HfO2 and charge trap property of Al2O3/HfO2/SiO2 stacks
Keywords: تله شارژ; ALD HfO2; Charge trapping; NAND flash memory; HfO2 crystal phase; Memory window;
Physical and electrical properties of flash memory devices with nickel oxide(NiO2) charge trapping layer
Keywords: تله شارژ; MOHOS; Charge trapping; RTA; NiO2;
Nitrogen doped multilayer photo catalytically reduced graphene oxide floating gate: Al/PMMA/NrGO/SiO2/p-Si/Au based hybrid gate stack for non volatile memory applications
Keywords: تله شارژ; Reduced graphene oxide (rGO); Nitrogen doping; Photo-catalytic; Flash memory; Charge trapping; Organic flexible electronics;
Remarkable charge-trapping performance based in Zr0.5Hf0.5O2 with nanocrystal Ba0.6Sr0.4TiO3 blocking layer for nonvolatile memory device
Keywords: تله شارژ; Charge trapping; Nanocrystal; Ba0.6Sr0.4TiO3 blocking layer; Zr0.5Hf0.5O2; Nonvolatile memory;
Nb-doped Ga2O3 as charge-trapping layer for nonvolatile memory applications
Keywords: تله شارژ; Nonvolatile memory; Charge trapping; High-k dielectric; Nb-doped Ga2O3;
Organic nonvolatile memory devices utilizing intrinsic charge-trapping phenomena in an n-type polymer semiconductor
Keywords: تله شارژ; Organic nonvolatile memory device; Charge trapping; n-Channel polymer transistor; Switching phenomenon; Polymer end capping
Programming a nonvolatile memory-like sensor for KRAS gene sensing and signal enhancement
Keywords: تله شارژ; Voltage program; EONOS; EIS; Charge trapping; KRAS gene;
Model based precise analysis of the injection currents in Al/ZrO2/Al2O3/ZrO2/SiO2/Si structures for use in charge trapping non-volatile memory devices
Keywords: تله شارژ; High-к dielectrics; Zirconium oxide; Charge trapping; Charge trapping memory; Conduction mechanisms in solids
Hysteresis in organic-inorganic hybrid perovskite solar cells
Keywords: تله شارژ; Perovskite solar cells; Hysteresis; Ferroelectricity; Ion migration; Charge trapping; Capacitance effects; Slow transient response;
Dependence of photocurrent of poly(3-hexylthiophene)/n-type Si diodes upon incorporation of ZnO nanoparticles
Keywords: تله شارژ; Polymer; Photocurrent; ZnO; Si; Charge trapping;
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
Keywords: تله شارژ; Bias Temperature Instability (BTI); Charge trapping; Performance degradation (aging); Random Telegraph Signal (RTS); Random Telegraph Noise (RTN)
Temperature-dependent current conduction mechanism and charge trapping in Ta2O5 RF-sputtered on GaN
Keywords: تله شارژ; MOS; GaN; Ta2O5; High-k dielectric; Charge trapping;
HKMG CMOS technology qualification: The PBTI reliability challenge
Keywords: تله شارژ; PBTI; High-k; Qualification; Charge trapping; HfO2; Threshold voltage instability
Reliability characterization of MEMS switch using MIM test structures
Keywords: تله شارژ; MIM capacitors; ICPCVD; Silicon nitride; Charge trapping; MEMS; Reliability
Improvement of charge trapping characteristics of Al2O3/Al-rich Al2O3/SiO2 stacked films by thermal annealing
Keywords: تله شارژ; Radio-frequency magnetron sputtering; Oxides; Aluminum oxide; Silicon dioxide; Charge trapping; Capacitance-voltage measurements; Thermal annealing;
Electrical property relaxation characteristics of UV-treated ZnO-based thin film transistors
Keywords: تله شارژ; Zinc oxide; Transparent thin film transistor; Ultraviolet treatment; Charge trapping; Oxygen vacancy ionization; X-ray photoelectron spectroscopy; Secondary ion mass spectrometry; Ultraviolet photoelectron spectroscopy;
Degradation of AlGaN/GaN HEMT devices: Role of reverse-bias and hot electron stress
Keywords: تله شارژ; Gallium nitride; HEMT; Reliability; Degradation; Charge trapping;
Charge trapping in poly(1-amino-anthraquinone) films
Keywords: تله شارژ; Anthraquinone; Polymer; Charge trapping; Voltammetry; Impedance;
Shadowed off-axis production of Ge nanoparticles in Ar gas atmosphere by pulsed laser deposition: Morphological, structural and charge trapping properties
Keywords: تله شارژ; 81.05.Hd; 81.07.Bc; 81.15.Fg; 61.46.Hk; 73.61.Le; Germanium; Nanostructures; Pulsed laser deposition; Charge trapping;
Impact of the interfaces in the charge trap layer on the storage characteristics of ZrO2/Al2O3 nanolaminate-based charge trap flash memory cells
Keywords: تله شارژ; Charge trapping; Nanolaminate; Interfaces; Memory cells; Dielectrics
Theoretical study of charge trapping levels in silicon nitride using the LDA-1/2 self-energy correction scheme for excited states
Keywords: تله شارژ; Silicon nitride; Charge trapping; SONOS; LDA-1/2; Self energy correction; Computational materials
Stability of valence alternation pairs across the substoichiometric region at Ge/GeO2 interfaces
Keywords: تله شارژ; Substoichiometric oxides; Charge trapping
Comparison of the carrier mobility, unipolar conduction, and light emitting characteristics of phosphorescent host–dopant system
Keywords: تله شارژ; Phosphorescent; Mobility; Hole current; Charge trapping; Device lifetime