کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
540902 1450400 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Transitioning of direct e-beam write technology from research and development into production flow
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Transitioning of direct e-beam write technology from research and development into production flow
چکیده انگلیسی

The electron beam direct write (EBDW) lithography solution is already mature enough to be used for semiconductor manufacturing. This paper illustrates the potential of EBDW to support technology development as a patterning technique complementary to the projection optical lithography. The first classical application of EBDW lithography is to support the research and development efforts (R&D) well before the optical scanners with required resolution are available. EBDW can potential lower the cost of manufacturing by eliminating very expensive masks for critical layers. Benefits of mask less solution in terms of cycle time, flexibility is presented through integration examples confirming the potential of this technique for semiconductor manufacturing.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 83, Issues 4–9, April–September 2006, Pages 749–753
نویسندگان
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