Photoluminescence enhancement of GaN-based LEDs structure with nano-grayscale multiple quantum wells using electron beam lithography

Photoluminescence (PL) enhancement is achieved by using a novel nano-grayscale (NGS) InGaN/GaN multiple quantum wells (MQWs) structures. NGS patterns on the n-GaN layer were fabricated with a low contrast electron beam resist by electron beam lithography and inductively coupled plasma dry etching process. The periods of NGS patterns on the n-GaN layer are 100 and 200 nm. NGS InGaN/GaN MQWs structure on the n-GaN layer was realized by subsequent epitaxial growth with metalorganic vapor phase epitaxy (MOVPE). Photoluminescence studies reveal that the LEDs with NGS InGaN/GaN MQWs structures show up to 28.5% enhancement of luminescence intensity compared to the sample with conventional flat MQWs structure. In addition, the PL emission peak shows a blue shift from 452 (flat MQWs) to 446 nm (NGS sample with a 200 nm period), which may be explained by a partial strain release in MQWs that induces a lower piezoelectric field in the active layer.

Figure optionsDownload as PowerPoint slideHighlights
► We made various shapes of multiple quantum wells with nano-grayscale structures.
► Multiple overlapped design was used using an electron beam lithography.
► Period and shape dependencies for nano-grayscale patterns were investigated.
► PL intensity for nano-grayscale multiple quantum wells was evaluated.
► Enhancement of PL depended on various periods and shapes.