کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5435753 1509536 2017 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Experimental quantification of mechanically induced boundary migration in nanocrystalline copper films
ترجمه فارسی عنوان
اندازه گیری تجربی از مهاجرت مرزی ناشی از مکانیکی در فیلم های نانوسیم کریستالی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
چکیده انگلیسی

A new experimental technique is presented that combines in situ straining with transmission electron microscope-based automated crystal orientation mapping to document microstructural evolution with nanoscale resolution at sequential stages of deformation. Orientation maps of freestanding annealed nanocrystalline Cu films have been collected, and the resultant datasets provide direct measures of grain size, shape and orientation as well as local grain boundary character and position at various stages of applied strain. Numerous examples of stress-driven grain boundary and twin boundary migration were recorded and studied. Detailed analysis of the misorientation of mobile and immobile grain boundaries provided clear experimental evidence that a broad range of grain boundaries are susceptible to stress-assisted migration; no general correlation between grain boundary misorientation and mobility was detected. Incoherent Σ3 boundaries were observed to be significantly more mobile than coherent Σ3 twin boundaries. Nevertheless, deformation twins were observed to nucleate and grow from grain boundaries and triple points.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 140, November 2017, Pages 46-55
نویسندگان
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