کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5436363 1509550 2017 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
چکیده انگلیسی

The contribution of 180° domain wall motion to polarization and dielectric properties of ferroelectric materials has yet to be determined experimentally. In this paper, an approach for estimating the extent of (180°) domain reversal during application of electric fields is presented. We demonstrate this method by determining the contribution of domain reversal to polarization in soft lead zirconate titanate during application of strong electric fields. At the maximum applied field, domain reversal was determined to account for >80% of the measured macroscopic polarization. We also apply the method to quantify the contribution of domain reversal to the weak-field dielectric permittivity of BaTiO3. The results of this analysis determined that domain reversal accounts for up to ∼70% of the macroscopic dielectric permittivity in BaTiO3. These results demonstrate the predominance of domain reversal to high and low-field dielectric response in ferroelectric polycrystalline materials.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 126, March 2017, Pages 36-43
نویسندگان
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