Concentration and composition of gas inclusions in some oxide crystals

A method of concentration of gas impurities contained in a melt into sealed cavities in a crystal has been proposed for the first time. This makes it possible to determine the amount of gases dissolved in the melt during crystallization by the Edge-defined Film-fed Growth (EGF) technique and the gas pressure in cavities inside the crystals. We also measure the composition of gas inclusions in crystallized melts of Al2O3, Y3Al5O12 and Bi4Ge3O12 and discuss it in connection with crystal growth procedure and quality of crystals.