کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
6535408 49300 2015 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Micro-structural defects in polycrystalline silicon thin-film solar cells on glass by solid-phase crystallisation and laser-induced liquid-phase crystallisation
ترجمه فارسی عنوان
نقص های میکرو سازنده در سلول های خورشیدی نازک سیلیکون پلی کریستالیک بر روی شیشه به وسیله کریستالیزاسیون جامد و فرایند مایع فیزیکی ناشی از لیزر
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی کاتالیزور
چکیده انگلیسی
The microstructural properties of polycrystalline silicon films obtained by either solid-phase crystallisation (SPC) or laser-induced liquid-phase crystallisation (LPC) were investigated by transmission electron microscopy (TEM). In SPC films, the most common intra-grain defects are dislocations with the density as high as 1E10 cm−2 determined from cross-sectional weak-beam dark-field images. The highest dislocation density in LPC film is at least two orders of magnitude lower than the SPC film, 1E8 cm−2 and typically it is below 1E6 cm−2. The most common defect type in LPC films is twin boundaries and other junctions of different coincidence site lattice (CSL) boundaries. Such differences in the material structural properties result in far superior electrical performance of solar cells made of LPC films, such as mobility up to 400 cm2 V−1 s−1, similar to c-Si wafers, and the higher open-circuit voltage up to 585 mV.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solar Energy Materials and Solar Cells - Volume 132, January 2015, Pages 282-288
نویسندگان
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