Redox Titrations via Surface Interrogation Scanning Electrochemical Microscopy at an Extended Semiconducting Surface for the Quantification of Photogenerated Adsorbed Intermediates

Redox Titrations via Surface Interrogation Scanning Electrochemical Microscopy at an Extended Semiconducting Surface for the Quantification of Photogenerated Adsorbed Intermediates

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Electrochimica Acta - Volume 179, 10 October 2015, Pages 74-83

Burton H. Simpson, Joaquín Rodríguez-López,