Electrical characterization of top-gated molybdenum disulfide metal-oxide-semiconductor capacitors with high-k dielectrics

Electrical characterization of top-gated molybdenum disulfide metal-oxide-semiconductor capacitors with high-k dielectrics

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 147, 1 November 2015, Pages 151-154

P. Zhao, P.B. Vyas, S. McDonnell, P. Bolshakov-Barrett, A. Azcatl, C.L. Hinkle, P.K. Hurley, R.M. Wallace, C.D. Young,