کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7058902 | 1458081 | 2013 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectral radiative properties of tungsten thin films in the infrared
ترجمه فارسی عنوان
خواص شعاعی طیفی فیلمهای نازک تنگستن در مادون قرمز
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کلمات کلیدی
عملکرد دی الکتریک، فرو سرخ، خواص شعاعی، فیلم نازک، تنگستن،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
جریان سیال و فرایندهای انتقال
چکیده انگلیسی
Tungsten is an important material for energy harvesting applications due to its high chemical and thermal stability; however, the difficulty in obtaining single-crystal films leads to a large variation in the optical properties. The present work focuses on the radiative and optical properties of thin tungsten films at wavelengths from 1 to 20 μm (wavenumbers from 10,000 to 500 cmâ1), considering microstructural variations. Four films of a nominal thickness of 70 nm were deposited on silicon substrates using DC magnetron sputtering, and the effect of pre- and post-deposition treatments was investigated. Several analytical instruments were used to characterize the crystalline phases and microstructures, including X-ray diffraction, Rutherford backscattering, X-ray photoelectron spectroscopy, and scanning electron microscopy. The transmittance and reflectance of the film-substrate composites were measured at room temperature using a Fourier-transform infrared spectrometer. The dielectric function of each sample was obtained by fitting the measured radiative properties using the Drude-Lorentz dispersion model. The difference in the radiative properties between samples was analyzed and related to the crystalline phases and density.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Heat and Mass Transfer - Volume 61, June 2013, Pages 106-113
Journal: International Journal of Heat and Mass Transfer - Volume 61, June 2013, Pages 106-113
نویسندگان
J.I. Watjen, T.J. Bright, Z.M. Zhang, C. Muratore, A.A. Voevodin,