کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7118628 1461406 2015 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Atomic-scale tomography of semiconductor nanowires
ترجمه فارسی عنوان
توموگرافی مقیاس اتمی نانوسیمهای نیمه هادی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
چکیده انگلیسی
Atomic-scale structure and composition is critical to understand the novel properties and to realize the technological applications of semiconductor nanowires. This paper reviews the latest progresses in atomic-scale tomography of various semiconductor nanowires for application in electronics, photonics, thermoelectrics and photovoltaics. In practice, specimen preparation is usually the obstacle for the atomic-scale tomographic experiment. In this regard, promising specimen preparation methods from semiconductor nanowires are also summarized and compared. The unprecedented information extracted from 3D reconstruction of tomographic data provides deep insight into semiconductor nanowires and enables understanding of properties and optimization of growth.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 40, December 2015, Pages 896-909
نویسندگان
, , ,