کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7118883 1461406 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structural characterization and optical properties of thermally evaporated AgSb0.75In0.25Se2 thin films
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Structural characterization and optical properties of thermally evaporated AgSb0.75In0.25Se2 thin films
چکیده انگلیسی
Polycrystalline AgSb0.75In0.25Se2 ingot material was prepared by direct fusion of the mixtures of their constituent elements in vacuum-sealed silica tube. The structural characterization of the prepared ingot material was investigated using X-ray diffraction technique. Thin films of the reveiously prepared bulk material were deposited at room temperature using conventional thermal evaporation technique. The structural characterization of the deposited films performed using X-ray diffraction and transmission electron microscope, showed that the as-deposited film has an amorphous phase, whereas those annealed at temperatures Ta≥453K are crystalline. The chemical composition of the deposited films was examined using energy dispersive X-ray analysis. The optical properties of the amorphous and crystalline films have been determined from the transmission spectra using envelope method. The refractive index is adequately described in terms of the single-effective-oscillator model proposed by Wemple-DiDomenico. The optical band gap of the amorphous and crystalline films has been determined from the analysis of the optical absorption coefficient.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 40, December 2015, Pages 369-373
نویسندگان
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