Channel length influenced contribution of hole and electron trapping effect to threshold voltage stability in organic field effect transistors

Effect of channel length on hysteresis and threshold voltage shift in copper phthalocyanine (CuPc) based organic field effect transistors was studied. Contrary to expectation, longer channel length devices exhibited minimum threshold voltage shift. Influence of channel length on the contribution of hole and electron trapping to threshold voltage stability was determined. Shortest channel length devices exhibited highest electron trapping effect while longest channel devices exhibited minimum hole as well as electron trapping. Lower hole trap effect for longer channel length devices was suggested to be due to reduced longitudinal field between source and drain electrodes while minimum electron trapping was attributed to suppression of drain current by increased hole trap centres.