کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
728873 892858 2012 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Advances in positron annihilation spectroscopy of Si, Ge and their alloys
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Advances in positron annihilation spectroscopy of Si, Ge and their alloys
چکیده انگلیسی

Studies on vacancy defects in Si, SiGe and Ge with positron annihilation spectroscopy are reviewed. The E-centers involving As and Sb in Si are identified and their thermal stability is studied in annealing experiments. In SiGe the influence of Ge on both the thermal stability of the E-center and its effect on the charge transitions of the E-center is reviewed. The positron annihilation specific defect parameters are determined for the divacancy and the monovacancy in Ge.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 15, Issue 6, December 2012, Pages 669–674
نویسندگان
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