کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
748805 894790 2012 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Dynamic switching characteristic dependence on sidewall angle for phase change memory
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Dynamic switching characteristic dependence on sidewall angle for phase change memory
چکیده انگلیسی

In this paper, the volume-minimized model of phase change memory (PCM) cell with Ge2Sb2Te5 (GST) material has been established to study the dynamic switching (set-to-reset) characteristic dependence on the sidewall angle. Joule heating volume, threshold current, dynamic resistance and phase transition rate of PCM cells by current pulse are all calculated. The results show that the threshold current increases with decreasing the sidewall angle and is significantly impacted by the feature size and aspect ratio. The PCM cell of 90° sidewall angle exhibits the smallest Joule heating volume, the highest RESET resistance and the fastest phase transition property.


► We model the volume-minimized type of phase change memory cell.
► The dynamic switching characteristic dependence on the sidewall angle is researched by applying current pulse.
► The threshold current increases with decreasing the sidewall angle and is impacted by the feature size and aspect ratio.
► The PCM cell of 90 shows the smallest Joule heating volume and the highest RESET resistance.
► The PCM cell of 90 exhibits the fastest phase transition property.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid-State Electronics - Volume 67, Issue 1, January 2012, Pages 1–5
نویسندگان
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