Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)

Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Talanta - Volume 131, January 2015, Pages 505-509

S. Thangavel, K. Dash, S.M. Dhavile, A.C. Sahayam,